Universidad de Jaén

Chapter 1. Introduction
Definitions. Technical evolution of IC. Integration Scales. Manufacturing processes of IC. Signals and variables. Measuring systems. Static/dynamic characteristics. CAD Tools.

Chapter 2. Amplification stages
Introduction. Review of BJTs and MOSFETs. Amplification stages based on MOSFET transistors: common source, common gate and common drain. Current sources: current mirrors, cascode source and current multipliers

Practical session 1: Comparison between two CMOS amplification stages

Chapter 3. Differential amplifier
Introduction. The MOSFET differential amplifier. DC and AC response. Differential mode gain. Common mode gain. Common-mode rejection ratio (CMRR). Input and output resistance in common mode. Input and output resistance in differential mode.

Practical session 2: Characterisation of an active-loaded differential amplifier

Chapter 4. Operational amplifiers.
Introduction. Parts of a simple operational amplifier: differential stage, amplification stage, DC power supply stage and output stage. Study of the OTA Miller amplifier. Real response of a operational amplifier. Instrumentation amplifiers.

Practical session 3: Open loop characterisation of the OTA-Miller amplifier

Chapter 5. Introduction to instrumentation systems.

Overall schematic of an intrumentation system. Sensors and trannsducers. Signal conditioning. Analog to digital converters. Static and dynamic features of instrumentation systems. Acquisition, analysis, and data storage using LabView. Errors and uncertainty analysis.

Practical session 4: Introduction to Labview

Chapter 6. Temperature measurements

Introduction. Thermistors, thermocouples and RTDs. Signal conditioning for temperature sensors. Integrated temperature sensors.

Practical session 5: Temperature measurement

Chapter 7. Magnetic sensors

Introduction. Fundamentals of Hall Effect. Hall linear sensors. Commercial hall sensors.

Practical session 6: Current measurement by hall effect sensor.

Chapter 8. Resistive sensors

Introduction. P otentiometer transducer. Strain gauges. Light dependent resistors. Applications

Chapter 9. Electronic power drivers

Introduction. Electronic devices used for designing electronic power drivers. Non-Insulated power drivers. Insulated power drivers. Thermal management

Practical session 7: Labview application: measuring, control and data analysis

The methodology followed in this subject are based on four main points:
1) Lessons and seminars. It means master lectures delivered by the professor where the active participation of the students is going to be boosted.
2) Practical lessons. These lessons will be delivered in the laboratory in groups where the maximum number of student per group will not be more that 20 people. These lessons will allow to put in practice the concepts which will be describe through the theoretical lessons.
3) Presentations by the students in class. The students will expose their works about some topics which it will be proposed by the professor.
4) Tutorial sessions in group or individual. This activity will allow to give a more personal answer to the doubts that the students will have along the academic year.

Students with special educational needs should contact the Student Attention Service (Servicio de Atención y Ayudas al Estudiante) in order to receive the appropriate academic support

The evaluation of the subject is based on four points:

1) Attendance and active participation in lectures. This point will represent 5% of the final mark.

2) Problems resolution and/or presentations in class. This point will represent  25% of the final mark. The problems will have to be solved and given for its correction by the professor. The presentations will consist in a hour of speech of a proposed topic by the professor.  

3) Design and implementation of electronic circuits in practical sessions. This point will represent the 35% of the final mark. There will be practical sessions which are going to be corrected in the laboratory and other ones which will be necessary to prepare a final report.

4) Written exam.  This point will represent 35% of the final mark.

The first point described above is aimed to evaluate the progress of the students in order to achieve the competences CB6, CG1, CG2, CG3, CT1 and CT5. Moreover, the following results of the learning are also evaluated by this activity: Resul-16 and Result-17.

The second point described above is aimed to evaluate the progress of the students in order to achieve the competences CB6, CE12, CG5 and CT1. Moreover, the following results of the learning are also evaluated by this activity: Resul-16, Resul-17, Resul-18 and Result-19.

The third point described above is aimed to evaluate the progress of the students in order to achieve the competences CB6, CE10, CE11, CE12, CE13, CE14, CG4, CG5 and CT2. Moreover, the following results of the learning are also evaluated by this activity: Resul-16, Resul-17, Resul-19 and Result-20.

The fourth point described above is aimed to evaluate the progress of the students in order to achieve the competences CB7, CE10, CE12, CG4, CG5 and CT1. Moreover, the following results of the learning are also evaluated by this activity: Resul-18, Resul-19 and Resul-20.

Note: There is not a minimum mark  (for any of the points above described) that the students have to achieve to compute the mean of the three parts (overall mark).